Scitech introduces the nanoIR2-s,
the only nanoscale IR spectroscopy and imaging platform featuring AFM-IR true
model-free IR absorption spectroscopy and s-SNOM sub-20 nm complex optical
property imaging capabilities.
The latest addition to Anasys
Instruments’ award-winning portfolio of products that provide nanoscale probe
based analytical techniques while providing high quality atomic force
microscope (AFM) imaging, the nanoIR2-s finds use in various applications.
AFM-IR and s-SNOM are
complementary techniques with different strengths; the nanoIR2-s allows the
user to choose a configuration that has one technique or both, depending on specific
sample and measurement needs.
AFM-IR true model-free IR absorption spectroscopy
AFM-IR directly detects light
absorbed by the sample using the AFM probe tip to sense thermal expansion. This
thermal expansion depends primarily on the sample’s absorption coefficient, ks,
and is largely independent of other optical properties of the tip and sample. Preferred
for measurements where an accurate absorption spectrum is desired, AFM-IR is
the best technique for soft matter samples with large thermal expansion, providing
true model-free IR absorption spectroscopy without band distortions and peak
s-SNOM sub-20 nm complex optical property imaging
s-SNOM detects light scattered
by nanometer scale regions directly under the AFM probe tip. The scattered
field depends on the complex optical constants of both the tip and sample and
contains rich information about nano-optical phenomena. Reference samples (e.g.
gold or silicon) are required to separate the sample response contributions
from the source and tip. Modelling support may be needed to interpret the
results. A compelling technique for imaging nanoscale contrast in optical
properties, s-SNOM has diverse applications in advanced materials, devices and
fundamental light/matter interactions, and is considered the best technique for
hard matter samples that efficiently scatter light.
nanoIR2-s finds use in applications
involving polymers, blends and composites; organics and life sciences; graphene/boron
nitride.2D materials; nano-antennas/photonics; inorganics and semi-conductors; IR
absorption spectroscopy; correlation to FTIR; unknown analysis; wavelength dependent
complex optical properties; chemical compositional imaging; rapid point
spectroscopy; and surface sensitive/ultimate spatial resolution.