MIPAR image analysis software for material science

Scitech presents MIPAR,
a revolutionary image analysis software, capable of identifying and measuring
features from nearly any image captured by an electron microscope or optical
microscope. MIPAR image analysis software uses recipes from an extensive online
library or custom created as part of the software subscription. Recipes allow similar
images to be processed very quickly and consistently.

This user-friendly
software enables users to test samples such as nickel, titanium, steel,
composites and fibres among others, and develop a recipe to detect features of
interest. Users have the flexibility to add, delete, move and edit steps in any
order.

With MIPAR you can
detect almost any feature you can identify with your eyes. It enables users to
create application specific recipes and efficient image processing workflows. Once
a user has developed a recipe for an image, it can easily be applied to other
similar images in the batch processor. The subsequent results can be analysed
by making global, feature and local measurements.

Some examples of
existing MIPAR recipes include: Particle Sizing, Morphology and Shape; Porosity
and Pore measurement in Foams; Fibre Diameter Distribution; Filter and Fabric
Porosity; Grain Structures in Metals and Composites; and BiModal particles in
Metal Structures like Titanium.

For more
information, please visit the Scitech website www.scitech.com.au
or call (03) 9480 4999.

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